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In this paper, we propose a pulse delay circuit using a differential buffer ring. The proposed circuit keeps an input pulse propagating on the buffer ring without a degradation of pulse width information. The cross-coupled buffer ring with compensating inverters improves the tolerance to the process variation. The proposed circuit has been implemented using 65nm CMOS process, and the simulation results...
The performance and robustness to PVT variations has been measured of an improved Self Synchronous FPGA (SSFPGA) designed in 65 nm CMOS which achieves 2.97 GHz throughput at 1.2V. The proposed SSFPGA employs a 38×38 array of 4-input, 3-stage Self Synchronous Configurable Logic Blocks, with the introduction of a new dual tree-divider 4 input LUT to achieve a 4.5× throughput improvement...
In this paper, a new peak hold circuit which detects the top value and the bottom value of the power supply noise of a VLSI circuit is proposed. We can make a noise map by distributing the circuit over the chip and find hot-spots in which large power supply noise occurs. This circuit needs no extra clean power supply or external clock signal. Also, low power consumption can be expected because it...
This paper proposes a resonant supply noise canceller utilizing parasitic capacitance of sleep blocks. It has small area penalty because we use sleep blocks for noise cancelling. Measurement results show that the test chip fabricated in a 0.18μm CMOS process achieved 43.3% and 12.5% supply noise reduction on the abrupt supply voltage switching and the abrupt wake-up of a sleep block, respectively...
We have compared the power supply noise tolerance of a synchronous processor and a self-timed processor fabricated using 0.18mum CMOS. We have designed the self-timed processor using the same RTL as the synchronous processor, and translated it into a netlist with DCVSL circuits and completion logic trees. We have demonstrated the synchronous processor shows an error rate of 9.3% for the worst power...
This paper presents measurement results on datapath delay distributions for data/instruction against Process, Voltage and Temperature (PVT) variations in 90 nm CMOS. Datapath delay has been measured using a completion signal generated at the end of datapaths with dual-rail logic according to data and instructions comprehensively for multiple Vdd and Temperature among several chips to show PVT variations...
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