Search results for: Chen-Chien Li
Microelectronics Reliability > 2017 > 79 > C > 136-139
IEEE Electron Device Letters > 2016 > 37 > 1 > 12 - 15
Microelectronics Reliability > 2015 > 55 > 11 > 2183-2187
Microelectronic Engineering > 2015 > 147 > C > 67-71
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1405 - 1410
Microelectronic Engineering > 2015 > 138 > Complete > 81-85
Solid State Electronics > 2014 > 101 > Complete > 33-37
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2662 - 2667
IEEE Electron Device Letters > 2014 > 35 > 5 > 509 - 511
Microelectronic Engineering > 2013 > 109 > Complete > 64-67
Solid State Electronics > 2012 > 78 > Complete > 17-21
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3543 - 3548
IEEE Electron Device Letters > 2012 > 33 > 2 > 188 - 190
Solid State Electronics > 2010 > 54 > 10 > 1160-1165