The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper describes how ASIC vendors can develop customized memory test algorithms to enhance their overall IC testing strategy. BIST test algorithm was used in order to address new defect mechanisms emerging at advanced process nodes.
The 1*3 linear array coupler can be readily fabricated with standard 2*2 coupler fabrication and monitoring equipment and leads to a variety of useful devices, which includes interesting replacements for 2*2 broadband and wavelength flat couplers.<<ETX>>
A simple circuit, which detects the time of maximum splitting ratio, is used for spectral alignment during the fabrication of wavelength flattened couplers. This significantly increases the yield of successful components.<<ETX>>
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.