Search results for: J.D. Cressler
2009 IEEE Custom Integrated Circuits Conference > 251 - 254
Nuclear Inst. and Methods in Physics Research, A > 2009 > 604 > 3 > 668-674
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3318 - 3325
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3402 - 3407
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3071 - 3077
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3393 - 3401
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 431 - 439
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3256 - 3261
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3469 - 3476
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3078 - 3084
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1914 - 1919
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2169 - 2177
IEEE Electron Device Letters > 2009 > 30 > 5 > 511 - 513
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 440 - 448
IEEE Electron Device Letters > 2009 > 30 > 5 > 508 - 510