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Scaling of technology over the last few decades has produced an exponential growth in computing power of integrated circuits and an unprecedented number of transistors integrated into a single chip. However, scaling is facing several problems - severe short channel effects, exponential increase in leakage current, increased process parameter variations, and new reliability concerns. We believe that...
This paper evaluates the severity of negative bias temperature instability (NBTI) degradation in two major circuit applications: random logic and memory array. For improved lifetime stability, we propose/select an efficient reliability-aware circuit design methodologies. Simulation results obtained from 65nm PTM node shows that NBTI induced degradation in random logic is considerably lower than that...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characterize and estimate the lifetime circuit reliability under NBTI degradation. Unlike conventional approaches, where a representative fMAX (maximum operating frequency) measurement from timing critical circuitry is used, we propose...
Super cut-off devices with sub-60mV/decade subthreshold swings have recently been demonstrated and being extensively studied. This paper presents a feasibility analysis of such tunneling devices for ultralow power subthreshold logic. Analysis shows that this device can deliver 800times higher performance (@iso-IOFF) compared to a MOSFET. The possible use of this device as a sleep transistor in conjunction...
The large supply voltage difference between sub-threshold core logic and I/O makes it extremely challenging to convert signals from core circuit to I/O circuit. In this paper, we propose two novel circuits, clock synchronizer and reduced swing inverter to design dynamic and static level converters for sub-threshold logic. Circuit simulations shows that our level converters work at frequency > 500kHz...
Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. However, the increasing circuit size limits the granularity of diagnosis, resulting in large suspect fault list. In this paper, we present a methodology for improving delay fault localization in test-per-scan BIST using on-die delay...
Negative bias temperature instability (NBTI) has become one of the major causes for temporal reliability degradation of nanoscale circuits. In this paper, we analyze the temporal delay degradation of logic circuits due to NBTI. We show that knowing the threshold voltage degradation of a single transistor due to NBTI, one can predict the performance degradation of a circuit with a reasonable degree...
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