Search results for: S. Cristoloveanu
Microelectronic Engineering > 2017 > 178 > C > 245-249
IEEE Electron Device Letters > 2017 > 38 > 2 > 157 - 159
Solid-State Electronics > 2017 > 128 > C > 80-86
Solid-State Electronics > 2016 > 125 > C > 167-174
NATO Science for Peace and Security Series B: Physics and Biophysics > Nanoscaled Semiconductor-on-Insulator Structures and Devices > Reliability and Characterization of Nanoscaled SOI Devices > 239-250
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Sensors and MEMS on SOI > 393-421
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Afterword > 425-441
Solid-State Electronics > 2016 > 116 > C > 8-11