Search results for: Guo-Quan Lu
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2575-2581
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2532-2541
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2524-2531
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2251 - 2256
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 214 - 219
IET Power Electronics > 2015 > 8 > 6 > 1009 - 1016
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 2 > 168 - 181
Journal of Electronic Materials > 2015 > 44 > 10 > 3973-3984
Journal of Electronic Materials > 2015 > 44 > 10 > 3788-3794
Journal of Applied Polymer Science > 131 > 23 > n/a - n/a
Journal of Materials Processing Tech. > 2014 > 214 > 9 > 1900-1908
Materials Letters > 2014 > 128 > Complete > 42-45
Materials Science & Engineering A > 2014 > 591 > Complete > 121-129
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 262 - 267
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 311 - 317
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 194 - 202
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 751 - 756
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 5 > 751 - 761
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 600 - 606