Search results for: Guo-Quan Lu
Journal of Alloys and Compounds > 2016 > 675 > C > 317-324
Microelectronics Reliability > 2016 > 63 > C > 104-110
Journal of Electronic Materials > 2016 > 45 > 11 > 5789-5799
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 10 > 10941- 10950
Materials Science and Engineering: A > 2016 > 660 > C > 71-76
Journal of Alloys and Compounds > 2016 > 659 > Complete > 95-100
Materials & Design > 2016 > 89 > C > 604-610
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2575-2581
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2532-2541
Microelectronics Reliability > 2015 > 55 > 12(PA) > 2524-2531
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2251 - 2256
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 214 - 219
IET Power Electronics > 2015 > 8 > 6 > 1009 - 1016