Search results for: J. Liu
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-1-1 - 4B-1-5
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1203 - 1208
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2177 - 2181
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-1-1 - 4B-1-5
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1203 - 1208
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2177 - 2181