Search results for: Maw-Shung Lee
Microelectronics Reliability > 2010 > 50 > 12 > 1984-1987
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2010 > 57 > 5 > 1237 - 1239
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2009 > 56 > 6 > 1246 - 1251
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2007 > 54 > 12 > 2456 - 2461
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2003 > 50 > 8 > 958 - 964
Journal of Electronic Materials > 2003 > 32 > 3 > 191-194