Search results for: X.A. Cao
Microelectronics Reliability > 2017 > 71 > Complete > 106-110
Organic Electronics > 2015 > 17 > C > 9-14
Microelectronic Engineering > 2014 > 114 > Complete > 17-21
Thin Solid Films > 2012 > 520 > 19 > 6130-6133
Organic Electronics > 2011 > 12 > 2 > 306-311
Organic Electronics > 2010 > 11 > 8 > 1338-1343
IEEE Electron Device Letters > 2009 > 30 > 11 > 1137 - 1139
Journal of Crystal Growth > 2007 > 300 > 2 > 382-386
IEEE Transactions on Electron Devices > 2007 > 54 > 12 > 3414 - 3417
Journal of Crystal Growth > 2006 > 291 > 1 > 82-85
Journal of Crystal Growth > 2004 > 269 > 2-4 > 242-248
Journal of Crystal Growth > 2004 > 264 > 1-3 > 172-177
Microelectronics Reliability > 2003 > 43 > 12 > 1987-1991
Solid State Electronics > 2003 > 47 > 10 > 1817-1823
Solid State Electronics > 2002 > 46 > 12 > 2291-2294
Solid State Electronics > 2002 > 46 > 8 > 1235-1239
Solid State Electronics > 2002 > 46 > 6 > 933-936
Materials Science & Engineering B > 2001 > 82 > 1-3 > 227 - 231
Solid State Electronics > 2000 > 44 > 12 > 2097-2100
Solid State Electronics > 2000 > 44 > 4 > 649-654