Search results for: Ningsheng Xu
IEEE Electron Device Letters > 2015 > 36 > 4 > 399 - 401
International Vacuum Nanoelectronics Conference > 131 - 132
Ultramicroscopy > 2009 > 109 > 10 > 1295-1298
IEEE Electron Device Letters > 2015 > 36 > 4 > 399 - 401
International Vacuum Nanoelectronics Conference > 131 - 132
Ultramicroscopy > 2009 > 109 > 10 > 1295-1298