Search results for: Ming Tan
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 904 - 913
IEEE Transactions on Power Electronics > 2011 > 26 > 6 > 1723 - 1732
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3494 - 3500
IEEE Transactions on Power Electronics > 2010 > 25 > 7 > 1685 - 1691
IEEE Electron Device Letters > 2009 > 30 > 3 > 250 - 253
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1277 - 1283
IEEE Electron Device Letters > 2008 > 29 > 1 > 80 - 82
IEEE Electron Device Letters > 2008 > 29 > 2 > 192 - 194
IEEE Electron Device Letters > 2008 > 29 > 7 > 750 - 752
IEEE Electron Device Letters > 2008 > 29 > 7 > 808 - 810
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2475 - 2483
IEEE Electron Device Letters > 2007 > 28 > 11 > 1014 - 1017
IEEE Electron Device Letters > 2007 > 28 > 10 > 905 - 908