Search results for: Ming Tan
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 904 - 913
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1277 - 1283
IEEE Electron Device Letters > 2008 > 29 > 2 > 192 - 194
IEEE Electron Device Letters > 2008 > 29 > 5 > 464 - 467
IEEE Electron Device Letters > 2008 > 29 > 7 > 750 - 752
IEEE Electron Device Letters > 2008 > 29 > 7 > 808 - 810
IEEE Transactions on Electron Devices > 2008 > 55 > 11 > 3048 - 3055