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ZrO2 thin films deposited on silicon wafer and glass substrate by dc magnetron sputtering with different deposition time. Film thickness and refractive index of ZrO2 films have been studied by using spectroscopic ellipsometry (SE) and spectrophotometric method (SM). The film thicknesses of both methods were compared with the film thickness which determined from field emission scanning microscopy (FE-SEM)...
We design, fabricate and demonstrate a hybrid nanocrystal/patterned p-i-n device that utilises fluorescence energy transfer and exhibits a three-fold increase of the measured photocurrent compared to its bare p-i-n counterpart.
We design, fabricate and demonstrate a hybrid nanocrystal/patterned p-i-n device that utilises fluorescence energy transfer and exhibits a three-fold increase of the measured photocurrent compared to its bare p-i-n counterpart.
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