The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Antiferroelectric PbZrO 3 thin films have been prepared on Pt/Ti/SiO 2 /Si(100) substrates by a simple sol-gel process. The structure and surface morphology evolution were investigated by an X-ray diffraction (XRD) and an atomic force microscopy (AFM), and a scanning electron microscopy (SEM), respectively. The results shows that the films grown on Pt/Ti/SiO 2 /Si (100) substrates...
Amorphous and crystalline PbZrO 3 thin films deposited on Si(100) substrate have been prepared by a sol-gel process. The crystal structure and surface morphologies of the thin films have been studied by X-ray diffraction and atomic force microscopy. The crystalline PbZrO 3 film on Si(100) substrate is a pseudocubic structure with a (111) orientation. The refractive index n and extinction...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.