Search results for: Katsuyoshi Miura
Microelectronics Reliability > 2011 > 51 > 9-11 > 1624-1631
Microelectronics Reliability > 2009 > 49 > 9-11 > 1116-1126
Auris Nasus Larynx > 2005 > 32 > 1 > 3-9
Journal of Electronic Testing > 1997 > 10 > 3 > 255-269
Microelectronic Engineering > 1996 > 31 > 1-4 > 319-330