Search results for: C.F. Tsang
Building and Environment > 2009 > 44 > 11 > 2256-2269
Building and Environment > 2009 > 44 > 3 > 534-545
Building and Environment > 2007 > 42 > 3 > 1335-1347
Building and Environment > 2006 > 41 > 3 > 254-261
Thin Solid Films > 2006 > 496 > 2 > 402-411
Building and Environment > 2005 > 40 > 8 > 1051-1067
Microelectronics Reliability > 2005 > 45 > 7-8 > 1134-1143
International Journal of Rock Mechanics and Mining Sciences > 2005 > 42 > 5-6 > 745-755
Microelectronics Reliability > 2005 > 45 > 3-4 > 517-525
International Journal of Refrigeration > 2005 > 28 > 2 > 288-305
Microelectronic Engineering > 2004 > 75 > 4 > 433-442
Microelectronics Journal > 2004 > 35 > 9 > 693-700
Thin Solid Films > 2004 > 462-463 > Complete > 245-249
Thin Solid Films > 2004 > 462-463 > Complete > 269-274
Microelectronics Journal > 2003 > 34 > 11 > 1051-1058
Microelectronics Reliability > 2000 > 40 > 7 > 1199-1206