Search results for: M. Inoue
2016 IEEE International Electron Devices Meeting (IEDM) > 11.1.1 - 11.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 5B.2.1 - 5B.2.5
2010 IEEE International Reliability Physics Symposium > 1001 - 1003
IEEE Communications Magazine > 2010 > 48 > 2 > 138 - 144
2009 IEEE 8th International Conference on ASIC > 609 - 612
IEEE Electron Device Letters > 2007 > 28 > 7 > 543 - 545
IEEE Electron Device Letters > 2007 > 28 > 10 > 868 - 870