Search results for: Ching Hung
Psychiatry Research > 2016 > 243 > C > 61-70
IEEE Electron Device Letters > 2013 > 34 > 5 > 635 - 637
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 347 - 350
Psychiatry Research > 2016 > 243 > C > 61-70
IEEE Electron Device Letters > 2013 > 34 > 5 > 635 - 637
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 347 - 350