Search results for: Shen Li Fu
Microelectronics Reliability > 2015 > 55 > 8 > 1248-1255
Electronic Materials Letters > 2014 > 10 > 2 > 497-502
Journal of Materials Science: Materials in Electronics > 2014 > 25 > 2 > 596-603
Journal of Materials Science: Materials in Electronics > 2013 > 24 > 9 > 3594-3602