Search results for: John J. Boeckl
Ultramicroscopy > 2017 > 183 > C > 67-71
Chemical Physics Letters > 2016 > 663 > C > 79-83
Advanced Materials > 22 > 37 > 4140 - 4145
Journal of Electronic Materials > 2009 > 38 > 6 > 725-730
Ultramicroscopy > 2017 > 183 > C > 67-71
Chemical Physics Letters > 2016 > 663 > C > 79-83
Advanced Materials > 22 > 37 > 4140 - 4145
Journal of Electronic Materials > 2009 > 38 > 6 > 725-730