Search results for: T. Conard
Child Development > 95 > 4 > 1425 - 1440
Engineering Materials and Processes > Materials for Information Technology > Advanced Materials Characterization > 437-447
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
Microelectronic Engineering > 2015 > 147 > C > 108-112
physica status solidi (a) > 210 > 10 > 2002 - 2007
Applied Surface Science > 2013 > 281 > Complete > 8-16
Microelectronic Engineering > 2013 > 109 > Complete > 46-49
Surface and Interface Analysis > 45 > 1 > 406 - 408
Surface and Interface Analysis > 45 > 1 > 430 - 433
Solid State Electronics > 2011 > 60 > 1 > 116-121
Microelectronic Engineering > 2011 > 88 > 5 > 690-693
Microelectronic Engineering > 2011 > 88 > 5 > 677-679
Surface and Interface Analysis > 42 > 6‐7 > 1057 - 1060
Microelectronic Engineering > 2009 > 86 > 7-9 > 1789-1795