Search results for: K.R. Hofmann
Microelectronic Engineering > 2013 > 109 > Complete > 152-155
Thin Solid Films > 2010 > 518 > 6 Supplement 1 > S281-S284
Microelectronics Journal > 2009 > 40 > 4-5 > 759-761
Applied Surface Science > 2008 > 255 > 3 > 778-780
Materials Science & Engineering B > 2008 > 147 > 2-3 > 213-217
Surface Science > 2006 > 600 > 18 > 3637-3641
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 473 - 478
Surface Science > 2003 > 532-535 > Complete > 633-638
Applied Surface Science > 2003 > 211 > 1-4 > 203-208
Thin Solid Films > 2002 > 410 > 1-2 > 72-75
Thin Solid Films > 1999 > 343-344 > Complete > 579-582
Electronics Letters > 1986 > 22 > 6 > 335 - 337
Electronics Letters > 1983 > 19 > 18 > 746 - 747
Electronics Letters > 1972 > 8 > 5 > 124 - 125
Electronics Letters > 1972 > 8 > 5 > 122 - 124