Search results for: Maurizio Vannoni

Items from 1 to 11 out of 11 results

article

Comparing single‐shot damage thresholds of boron carbide and silicon at the European XFEL

Marziyeh Tavakkoly, Jaromir Chalupsky, Vera Hajkova, Wolfgang Hillert, more

Journal of Synchrotron Radiation > 31 > 5 > 1067 - 1070

Xray free‐electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X‐ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing‐incidence...

article

The beam transport system for the Small Quantum Systems instrument at the European XFEL: optical layout and first commissioning results

Tommaso Mazza, Thomas M. Baumann, Rebecca Boll, Alberto De Fanis, more

Journal of Synchrotron Radiation > 30 > 2 > 457 - 467

The Small Quantum Systems instrument is one of the six operating instruments of the European XFEL, dedicated to the atomic, molecular and cluster physics communities. The instrument started its user operation at the end of 2018 after a commissioning phase. The design and characterization of the beam transport system are described here. The X‐ray optical components of the beamline are detailed, and...

article

Metrology characterization of ultraprecise bendable mirrors for the European XFEL: from offsite calibration to installation and commissioning

Maurizio Vannoni, Idoia Freijo Martín, Silja Schmidtchen, Thomas M. Baumann, more

Journal of Synchrotron Radiation > 26 > 4 > 1110 - 1114

The European XFEL requires long and ultraflat X‐ray mirrors of high precision for the beam offset and distribution system [Altarelli et al. (2006), XFEL Technical Design Report, DESY 2006‐097. DESY, Hamburg, Germany]. A general specification of the beam transport mirrors is a length of up to 950 mm and an optical surface with a deviation from a perfectly flat surface of <30 nm peak‐to‐valley and...

article

Characterization of an X‐ray mirror mechanical bender for the European XFEL

Maurizio Vannoni, Idoia Freijo Martín, Harald Sinn

Journal of Synchrotron Radiation > 23 > 4 > 855 - 860

One of the classical devices used to tune a mirror on an X‐ray optical setup is a mechanical bender. This is often designed in such a way that the mirror is held with clamps on both ends; a motor is then used to put a torque on the clamps, inducing a cylindrical shape of the mirror surface. A mechanical bender with this design was recently characterized, to bend a 950 mm‐long mirror up to a radius...

article

Characterization of a piezo bendable X‐ray mirror

Maurizio Vannoni, Idoia Freijo Martín, Frank Siewert, Riccardo Signorato, more

Journal of Synchrotron Radiation > 23 > 1 > 169 - 175

A full‐scale piezo bendable mirror built as a prototype for an offset mirror at the European XFEL is characterized. The piezo ceramic elements are glued onto the mirror substrate, side‐face on with respect to the reflecting surface. Using a nanometre optical component measuring machine and a large‐aperture Fizeau interferometer, the mirror profile and influence functions were characterized, and further...

article

Monitoring the thinning dynamics of soap films by phase shift interferometry. The case of perfluoropolyether surfactants

Cecilia M. C. Gambi, Maurizio Vannoni, Andrea Sordini, Giuseppe Molesini

The European Physical Journal E > 2014 > 37 > 2 > 1-8

An interferometric method to monitor the thinning process of vertical soap films from a water solution of surfactant materials is reported. Raw data maps of optical path difference introduced by the film are obtained by conventional phase shift interferometry. Off-line re-processing of such raw data taking into account the layered structure of soap films leads to an accurate measurement of the geometrical...

article

Improved accuracy phase retrieval in spatial phase-shifting interferometry

Maurizio Vannoni, Mauro Melozzi, Marco Barilli, Andrea Sordini, more

Optics Communications > 2012 > 285 > 5 > 517-520

Algorithms for phase retrieval in spatial phase-shifting interferometry are examined. It is noticed that the classical Carré technique based on four neighbor pixels may introduce shaped phase residuals that affect the accuracy of the reconstruction. A variant of the technique is proposed, taking into consideration five pixels and steering the phase retrieval algorithm to the appropriate subset so...

article

He–Ne laser wavelength-shifting interferometry

Maurizio Vannoni, Andrea Sordini, Giuseppe Molesini

Optics Communications > 2010 > 283 > 24 > 5169-5172

The use of wavelength-shifting interferometry with a He–Ne laser source is presented. The approach is based on the thermal expansion of the laser cavity during the warm-up time, in conjunction with an unequal path interferometric configuration. The optics principles are reviewed, and a demonstrative measurement is presented. The technique extends the capability of phase-shift acquisition and processing...

article

Finite element analysis of ion-implanted diamond surface swelling

Federico Bosia, Silvia Calusi, Lorenzo Giuntini, Stefano Lagomarsino, more

Nuclear Inst. and Methods in Physics Research, B > 2010 > 268 > 19 > 2991-2995

We present experimental results and numerical finite element analysis to describe surface swelling due to the creation of buried graphite-like inclusions in diamond substrates subjected to MeV ion implantation. Numerical predictions are compared to experimental data for MeV proton and helium implantations, performed with scanning ion microbeams. Swelling values are measured with white-light interferometric...

article

Intraocular lenses with surface aspherization: Interferometric study

Rita Mencucci, Ugo Menchini, Roberto Volpe, Maurizio Vannoni, more

Journal of Cataract & Refractive Surgery > 2007 > 33 > 9 > 1624-1630

To accurately evaluate in an optical laboratory 2 different types of intraocular lenses (IOLs).Department of Oto-Neuro-Ophthalmological Surgical Sciences and CNR-Institute for Applied Optics, Florence Italy.In this study, optical testing facilities based on interferometry were used. The IOLs were inspected with laser light, and interference patterns were acquired and processed, obtaining the physical...

article

Parallelism error characterization with mechanical and interferometric methods

Maurizio Vannoni, Roberto Bertozzi

Optics and Lasers in Engineering > 2007 > 45 > 6 > 719-722

Two methods for measuring the parallelism error of gauge blocks are discussed. The first method makes use of contact probes, sampling the gauge thickness at fixed locations; the parallelism error is given by the difference between maximum and minimum thickness over the sampled area. The second method is based on interferometry, producing the height maps of the opposing surfaces with respect to one...

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METROLOGY (3)
X‐RAY OPTICS (3)
ACTIVE OPTICS (2)
OPTICAL TESTING (2)
ATOMIC, MOLECULAR AND OPTICAL SCIENCE (1)
B4C COATING (1)
BENDABLE MIRROR (1)
BENDER (1)
DAMAGE THRESHOLD (1)
DIAMOND (1)
FLOWING MATTER: LIQUIDS AND COMPLEX FLUIDS (1)
FREE‐ELECTRON LASERS (1)
FREQUENCY SHIFTING 2010 MSC: 78A10 (1)
GAUGE BLOCKS (1)
INTERFEROMETRY (1)
ION DAMAGE (1)
METROLOGY COMPARISON (1)
MICROFOCUSING (1)
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PARALLELISM ERROR (1)
PHASE RETRIEVAL [2010] 78A10 (1)
PHASE-SHIFT INTERFEROMETRY (1)
PIEZO BIMORPH MIRROR (1)
RESPONSE FUNCTIONS (1)
SINGLE‐SHOT DAMAGE THRESHOLD (1)
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