Search results for: Takashi Sato
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1455 - 1466
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 833 - 843
IEEE Journal of Selected Topics in Quantum Electronics > 2013 > 19 > 4 > 1502608