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A device array circuit, scalable in terms of the number of transistors used, is proposed. The proposed array facilitates accurate and simultaneous bias voltage application to a large number of devices, making it suitable for the measurement-based statistical characterization of device degradation, known as bias temperature instability. Using the proposed array, the degradation measurement of thousands...
We propose a novel methodology for identifying thermal equivalent circuit of power MOSFETs through the measurement of thermal conduction characteristics. Drain current of the MOSFET is utilized to estimate channel temperature wherein heat is actually generated. Two measurement methods, i.e., constant voltage (CV) method and constant power (CP) method, are proposed. Those methods are different in the...
Field assisted air ionizer was proposed as a solution in order to neutralizing localized electrostatic charges gathered as both positively and negatively charged islands spread on the surface of the electrostatically charged products. This paper discusses about the basic characteristics and the operating conditions of the field assisted air ionizer.
A predictable device models should correctly handle parameter variations. Good recognition of the variation of physical parameters, which are being the sources of current variations of modern devices, is thus significantly important. In this paper, we present a practical procedure for decomposing device current variation into physical parameter variations. Based on the I-V curve measurements, two...
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