Search results for: P. Kurpas
Microelectronics Reliability > 2014 > 54 > 9-10 > 2191-2195
Microelectronics Reliability > 2011 > 51 > 9-11 > 1710-1716
2007 IEEE/MTT-S International Microwave Symposium > 1087 - 1090
Archives of Environmental Contamination and Toxicology > 2006 > 51 > 2 > 314-320
Microelectronics Reliability > 2003 > 43 > 6 > 839-844
Journal of Materials Science: Materials in Electronics > 2002 > 13 > 11 > 665-670
Journal of Crystal Growth > 2000 > 221 > 1-4 > 53-58
Journal of Electronic Materials > 2000 > 29 > 7 > 964-972
Journal of Electronic Materials > 2000 > 29 > 2 > 205-209
Applied Physics A > 1999 > 68 > 3 > 309-313
Materials Science & Engineering B > 1997 > 44 > 1-3 > 337-340
Journal of Electronic Materials > 1997 > 26 > 10 > 1154-1158
Journal of Electronic Materials > 1997 > 26 > 10 > 1159-1163
Journal of Crystal Growth > 1997 > 170 > 1-4 > 442-446
Journal of Crystal Growth > 1997 > 170 > 1-4 > 203-207
Electronics Letters > 1989 > 25 > 15 > 998 - 999