Search results for: Patrick Herfurth
IEEE Electron Device Letters > 2013 > 34 > 4 > 496 - 498
Microelectronics Reliability > 2012 > 52 > 9-10 > 1812-1815
physica status solidi c > 9 > 3‐4 > 945 - 948
IEEE Electron Device Letters > 2013 > 34 > 4 > 496 - 498
Microelectronics Reliability > 2012 > 52 > 9-10 > 1812-1815
physica status solidi c > 9 > 3‐4 > 945 - 948