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Study of surface morphologies reveals useful information about interfacial contacts and materials properties such as charge carrier mobility, optical absorption and adhesion that directly affect system performance. The total effective interface area and root mean square (rms) of surface height fluctuations are among the common parameters often used to corroborate device performance upon surface modification...
Surface morphologies are often used to characterize various interface processes including charge transfer and surface contact between layers in thin films. In fractal surface analysis, Hurst exponent is used as descriptor of surface roughness and the spectral exponent as long-range correlation between two spatially separated points. In this paper, an alternative surface model known as generalized...
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