The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Sandwich Ag/[CoPt(3 nm)/C(3 nm)] 5 /Ag films were deposited on glass substrates by magnetron sputtering. After annealing at 600 °C for 30 min, a nearly-perfect (001)-oriented L1 0 CoPt film with extremely high perpendicular anisotropy was obtained when the thickness of Ag top- and underlayer were both equal to 5 nm. The strain energy caused by the Ag layer together with the diffusion...
The microstructure and crystallinity of epitaxial YB 2 Cu 3 O 7−x (YBCO) thin films grown on a silicon using a buffer of Eu 2 CuO 4 (ECO)/Yttrium-stabilized Z r O 2 (YSZ) were investigated by X-ray high-resolution diffraction, small angle reflection, and reciprocal space map, as well as atomic force microscopy. The results showed that YBCO films...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.