Search results for: Z.H. Mai
Microelectronics Reliability > 2017 > 76-77 > C > 255-260
Microelectronics Reliability > 2017 > 76-77 > C > 141-144
Microelectronics Reliability > 2017 > 76-77 > C > 261-266
Microelectronics Reliability > 2017 > 73 > C > 76-91
Microelectronics Journal > 2017 > 62 > C > 38-42
Microelectronics Reliability > 2016 > 64 > C > 362-366
Microelectronics Reliability > 2016 > 64 > C > 321-325
Microelectronics Reliability > 2016 > 64 > C > 317-320
Microelectronics Reliability > 2016 > 64 > C > 357-361
Microelectronics Reliability > 2015 > 55 > 9-10 > 1611-1616
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 387 - 393
Physica B: Physics of Condensed Matter > 2006 > 382 > 1-2 > 193-200
Thin Solid Films > 2006 > 496 > 2 > 571-575
Applied Physics A > 2006 > 84 > 3 > 341-344