Search results for: A. Arapoyanni
Thin Solid Films > 2009 > 517 > 23 > 6375-6378
Microelectronics Reliability > 2008 > 48 > 8-9 > 1544-1548
IEEE Transactions on Computers > 2008 > 57 > 8 > 1032 - 1045
Journal of Electronic Testing > 2004 > 20 > 5 > 523-531
Journal of Electronic Testing > 2004 > 20 > 2 > 133-142
Integration, the VLSI Journal > 2002 > 31 > 2 > 183-194
Microelectronics Journal > 2001 > 32 > 1 > 75-80
Integration, the VLSI Journal > 2000 > 30 > 1 > 91-101