Search results for: J. Liu
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-1-1 - 4B-1-5
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 391 - 395
IEEE Electron Device Letters > 2012 > 33 > 4 > 585 - 587
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1203 - 1208
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2177 - 2181
IEEE Electron Device Letters > 2011 > 32 > 3 > 396 - 398
IEEE Electron Device Letters > 2010 > 31 > 5 > 476 - 478