Search results for: E. Zanoni
Microelectronics Reliability > 2012 > 52 > 9-10 > 2093-2097
Microelectronics Reliability > 2012 > 52 > 9-10 > 2426-2430
Microelectronics Reliability > 2012 > 52 > 9-10 > 2194-2199
Microelectronics Reliability > 2012 > 52 > 9-10 > 2153-2158
Microelectronics Reliability > 2012 > 52 > 8 > 1621-1626
2012 IEEE International Reliability Physics Symposium (IRPS) > 3D.4.1 - 3D.4.7
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.2.1 - CD.2.4
Microelectronics Reliability > 2011 > 51 > 9-11 > 1742-1746
Microelectronics Reliability > 2011 > 51 > 9-11 > 1747-1751
IEEE Electron Device Letters > 2011 > 32 > 4 > 488 - 490
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4
Microelectronics Reliability > 2010 > 50 > 9-11 > 1538-1542
physica status solidi (a) > 207 > 1 > 41 - 44
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 178 - 187
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 108 - 118
Microelectronics Reliability > 2009 > 49 > 9-11 > 1207-1210