Search results for: Jemin Park
Microelectronics Reliability > 2017 > 76-77 > C > 164-167
IEEE Electron Device Letters > 2009 > 30 > 12 > 1368 - 1370
Microelectronics Reliability > 2017 > 76-77 > C > 164-167
IEEE Electron Device Letters > 2009 > 30 > 12 > 1368 - 1370