Search results for: Hui Mei
IEEE Access > 2016 > 4 > 9589 - 9603
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2251 - 2256
IET Power Electronics > 2015 > 8 > 6 > 1009 - 1016
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 262 - 267
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 311 - 317
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 194 - 202
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 600 - 606
ICSSSM12 > 658 - 662
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 124 - 132