Search results for: Xia Zhang
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 263 - 268
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 226 - 232
Microelectronics Reliability > 2014 > 54 > 11 > 2355-2359
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2834 - 2838
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2868 - 2873
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2862 - 2867
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4555 - 4562
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4074 - 4079
IEEE Transactions on Electron Devices > 2013 > 60 > 7 > 2361 - 2367
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2974 - 2978
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2925 - 2929
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3066 - 3070