Search results for: C. Plossu
Materials Science & Engineering B > 2009 > 165 > 1-2 > 129-131
Microelectronic Engineering > 2009 > 86 > 7-9 > 1665-1667
Microelectronic Engineering > 2009 > 86 > 7-9 > 1686-1688
Microelectronic Engineering > 2009 > 86 > 7-9 > 1700-1702
Thin Solid Films > 2009 > 517 > 6 > 1868-1873
Microelectronic Engineering > 2007 > 84 > 9-10 > 2006-2009
Journal of Non-Crystalline Solids > 2007 > 353 > 16-17 > 1624-1630
Microelectronics Reliability > 2007 > 47 > 4-5 > 631-634
Microelectronics Reliability > 2007 > 47 > 4-5 > 729-732
Journal of Non-Crystalline Solids > 2005 > 351 > 21-23 > 1866-1872
Journal of Non-Crystalline Solids > 2005 > 351 > 21-23 > 1890-1896
Microelectronics Reliability > 2005 > 45 > 5-6 > 911-914
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 240-245
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 191-198
Journal of Non-Crystalline Solids > 2003 > 322 > 1-3 > 122-128
Journal of Materials Science: Materials in Electronics > 2003 > 14 > 5-7 > 311-314
Journal of Non-Crystalline Solids > 2001 > 280 > 1-3 > 103-109
Journal of Non-Crystalline Solids > 2001 > 280 > 1-3 > 116-121