Search results for: Tangbo Bai
Expert Systems with Applications > 2016 > 64 > C > 239-246
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 10 > 2293 - 2301
Infrared Physics & Technology > 2016 > 77 > C > 267-276
Expert Systems with Applications > 2016 > 64 > C > 239-246
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 10 > 2293 - 2301
Infrared Physics & Technology > 2016 > 77 > C > 267-276