Search results for: J. Xu
2011 International Reliability Physics Symposium > 5D.3.1 - 5D.3.6
2010 International Electron Devices Meeting > 34.1.1 - 34.1.4
2010 International Electron Devices Meeting > 11.6.1 - 11.6.4
Electronics Letters > 2007 > 43 > 16 > 884 - 886