Search results for: F. J. Vermersch
IEEE Photonics Technology Letters > 2008 > 20 > 13 > 1145 - 1147
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 1110 - 1114
Microelectronics Reliability > 2006 > 46 > 9-11 > 1715-1719
IEEE Photonics Technology Letters > 2008 > 20 > 13 > 1145 - 1147
IEEE Transactions on Nuclear Science > 2007 > 54 > 4-2 > 1110 - 1114
Microelectronics Reliability > 2006 > 46 > 9-11 > 1715-1719