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The paper discusses possibilities of rearranging test decompress or internal structure and linking its outputs with the parallel scan chain inputs in order to obtain better compression efficiency while the hardware overhead is not increased. We have experimentally verified that the controllability of decompress or outputs can be used as a simple and easily computable measure of the decompress or efficiency...
The paper presents a test pattern compression method for circuits with a high number of parallel scan chains. It reduces test time while it keeps hardware overhead low. The decompression method is based on the continuous LFSR reseeding that is used in such a way that it enables LFSR lockout escaping within a small number of clock cycles. It requires a separate controlling of the LFSR decompressor...
The paper describes a modified Smart BIST methodology that provides test data volume compression. The test equipment is easily applicable because it is based on the standard scan methodology. The method is based on continuous LFSR reseeding decompression that is used in such a way that it enables lockout escaping within a small number of clock cycles. It requires a separate controlling of the LFSR...
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