Search results for: Wei Cheng
Microelectronics Reliability > 2015 > 55 > 8 > 1163-1168
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 2-1 > 367 - 373
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1049 - 1055
IEEE Journal of Solid-State Circuits > 2013 > 48 > 2 > 358 - 368
IEEE Transactions on Electron Devices > 2007 > 54 > 7 > 1617 - 1625