Search results for: Wei Cheng
Microelectronics Reliability > 2016 > 60 > C > 20-24
Electronics Letters > 2016 > 52 > 3 > 232 - 234
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 588 - 594
IEEE Electron Device Letters > 2015 > 36 > 12 > 1261 - 1263
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 9 > 2756 - 2763
Microelectronics Reliability > 2015 > 55 > 8 > 1163-1168
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 109 - 114
Microwave and Optical Technology Letters > 57 > 4 > 817 - 820
Microelectronics Reliability > 2015 > 55 > 3-4 > 481-485
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 75 - 82
Microelectronics Journal > 2014 > 45 > 4 > 449-453
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1049 - 1055
IEEE Transactions on Microwave Theory and Techniques > 2012 > 60 > 3-1 > 502 - 508