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Due to the process variation, Spin Transfer Torque Magnetic Tunnel Junction (STT-MTJ) faces great challenges in fabrication process. Meanwhile, its neighbor CMOS is also influenced by significant process variation with the continuous technology scaling down. Both of the two effects lead to degraded performance of hybrid MTJ/CMOS circuit. This paper proposes a methodology to alleviate the impact of...
A reliable majority voter circuit using a nanometre spin transfer torque magnetic tunnel junction (STT-MTJ) is presented. The circuit tolerates single transient faults and manages process variations due to technology downscaling. The use of this magnetic device brings non-volatility memory to logic circuits and promises to overcome the rising standby power issue. By using the STMicroelectronics fully...
Variation afflicts the design, manufacture, and operation of integrated circuits. Statistical metrology seeks to characterize and model variations and their sources, particularly through new variation test circuits. Advanced process control attempts to reduce process variation through sensing and control during fabrication. Design for manufacturability seeks methods to improve performance and yield...
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