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By analyzing backscatter signal from antenna, using stacked rectangular metal patches, one could determine the characteristics (poles and zeros) of the antenna. In an ideal situation, when the incident chirp contains the resonant frequencies of the patch, the scattered signal would clearly display them. The characteristic parameters could then be used as a signature of the patch, i.e., information...
Stacked multilayer patch antennas as a candidate for sub-cent chipless RFID tags is proposed. The magnitude of scatter from such a structure ideally has negligible variation over frequency, but has predictable phase (delay) variation at pre-determined resonant frequencies. Such scattering structures can be modeled as all-pass networks and are expected to be more robust than non all-pass structures...
A novel technique for radio frequency identification devices (RFID) based on remote measurement of complex impedance at microwave frequencies is presented. The low cost read-only tags do not need semiconductor elements and can be implemented by printing a conducting pattern on a low cost dielectric substrate. Multiple tags are simultaneously illuminated by a chirped microwave signal with a bandwidth...
A novel technique for radio frequency identification devices (RFID) based on remote measurement of complex impedance at microwave frequencies is presented. The low cost read-only tags do not need semiconductor elements and can be implemented by printing a conducting pattern on a low cost dielectric substrate. Multiple tags are simultaneously illuminated by a chirped microwave signal with a bandwidth...
A novel technique for radio frequency identification devices (RFID) based on remote measurement of complex impedance at microwave frequencies is presented. The low cost read-only tags do not need semiconductor elements and can be implemented by printing a conducting pattern on a low cost dielectric substrate. Multiple tags are simultaneously illuminated by a chirped microwave signal with a bandwidth...
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