Search results for: W. L. Pearn
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 10 > 1576 - 1581
Soft Computing > 2016 > 20 > 4 > 1415-1435
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 424 - 430
Quality and Reliability Engineering International > 30 > 7 > 1075 - 1082
Quality and Reliability Engineering International > 29 > 6 > 899 - 909
Quality and Reliability Engineering International > 29 > 5 > 719 - 723
Quality and Reliability Engineering International > 29 > 4 > 487 - 507
Quality and Reliability Engineering International > 29 > 3 > 431 - 435
Quality and Reliability Engineering International > 29 > 2 > 277 - 284
Quality and Reliability Engineering International > 29 > 2 > 159 - 163
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 2 > 284 - 290
Central European Journal of Operations Research > 2012 > 20 > 1 > 65-85
Quality and Reliability Engineering International > 27 > 8 > 1119 - 1129
Central European Journal of Operations Research > 2011 > 19 > 4 > 533-545
Quality and Reliability Engineering International > 26 > 3 > 247 - 258
Journal of Applied Mathematics and Computing > 2010 > 32 > 1 > 39-58
Quality & Quantity > 2010 > 44 > 5 > 985-995
IEEE Transactions on Semiconductor Manufacturing > 2007 > 20 > 2 > 165 - 175
Quality & Quantity > 2007 > 41 > 5 > 757-777
Journal of Optimization Theory and Applications > 2007 > 135 > 2 > 285-299