Search results for: Wilfried Vandervorst
Surface and Interface Analysis > 52 > 12 > 786 - 791
physica status solidi (a) > 217 > 5 > n/a - n/a
physica status solidi (a) > 215 > 6 > n/a - n/a
physica status solidi (a) > 215 > 6 > n/a - n/a
physica status solidi (a) > 215 > 6 > n/a - n/a
Nano Research > 2018 > 11 > 8 > 4017-4025
Journal of Crystal Growth > 2018 > 483 > C > 285-290
physica status solidi c > 14 > 12 > n/a - n/a
Advanced Engineering Materials > 19 > 8 > n/a - n/a
Microelectronic Engineering > 2017 > 178 > C > 122-124
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-8.1 - PM-8.5
Microelectronic Engineering > 2017 > 167 > C > 47-51
Applied Surface Science > 2016 > 384 > C > 152-160
Applied Surface Science > 2016 > 365 > C > 143-152
Ultramicroscopy > 2015 > 159 > P2 > 438-444
physica status solidi (a) > 212 > 11 > 2595 - 2599
Journal of Crystal Growth > 2015 > 426 > C > 75-81
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1789 - 1795
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 2007 - 2013