Search results for: Feng Lin
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 266 - 268
IEEE Photonics Technology Letters > 2009 > 21 > 16 > 1142 - 1144
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 266 - 268
IEEE Photonics Technology Letters > 2009 > 21 > 16 > 1142 - 1144